Rei-Fu Huang: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

1

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Latchup test failure from ESD protection circuit activation beyond ESD stress condition

Lin, I-Cheng, Jao, Che-Yuan, Huang, Rei-Fu, Chien, Cheng-Hsing, Chuang, Chien-Hui, Chiang, Chen-Feng, Huang, Bo-Shih

Year:

2009

Language:

english

File:

PDF, 449 KB

english, 2009

2

[IEEE 2015 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2015.10.6-2015.10.8)] 2015 IEEE International Test Conference (ITC) - Testing methods for quaternary content addressable memory using charge-sharing sensing scheme

Yang, Hao-Yu, Huang, Rei-Fu, Su, Chin-Lung, Lin, Kuan-Hong, Shu, Hang-Kaung, Peng, Chi-Wei, Chao, Mango C.-T.

Year:

2015

Language:

english

File:

PDF, 920 KB

english, 2015

3

[IEEE 13th Asian Test Symposium - Kenting, Taiwan (15-17 Nov. 2004)] 13th Asian Test Symposium - On Test and Diagnostics of Flash Memories

Chih-Tsun Huang,, Jen-Chieh Yeh,, Yuan-Yuan Shih,, Rei-Fu Huang,, Cheng-Wen Wu,

Year:

2004

Language:

english

File:

PDF, 1.18 MB

english, 2004

4

[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - A built-in self-repair scheme for semiconductor memories with 2-d redundancy

Jin-Fu Li,, Jen-Chieh Yeh,, Rei-Fu Huang,, Cheng-Wen Wu,

Year:

2003

Language:

english

File:

PDF, 887 KB

english, 2003

5

Economic Aspects of Memory Built-in Self-Repair

Rei-Fu Huang, Chen Chao-Hsun, Wu Cheng-Wen

Journal:

IEEE Design & Test of Computers

Year:

2007

Language:

english

File:

PDF, 1.07 MB

english, 2007

6

[IEEE 13th Asian Test Symposium - Kenting, Taiwan (15-17 Nov. 2004)] 13th Asian Test Symposium - Fail Pattern Identification for Memory Built-In Self-Repair

Rei-Fu Huang,, Chin-Lung Su,, Cheng-Wen Wu,, Shen-Tien Lin,, Kun-Lun Luo,, Yeong-Jar Chang,

Year:

2004

Language:

english

File:

PDF, 102 KB

english, 2004

7

[IEEE ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 - Yohohama, Japan (27-30 Jan. 2004)] ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 (IEEE Cat. No.04EX753) - SRAM delay fault modeling and test algorithm development

Rei-Fu Huang,, Yan-Ting Lai,, Yung-Fa Chou,, Cheng-Wen Wu,

Year:

2004

Language:

english

File:

PDF, 309 KB

english, 2004

8

[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Testing methods for a write-assist disturbance-free dual-port SRAM

Yang, Hao-Yu, Lin, Chen-Wei, Huang, Chao-Ying, Lu, Ching-Ho, Lai, Chen-An, Chao, Mango C.-T., Huang, Rei-Fu

Year:

2014

Language:

english

File:

PDF, 293 KB

english, 2014

9

[IEEE Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. - San Jose, CA, USA (2004.08.10-2004.08.10)] Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004. - A parallel built-in diagnostic scheme for multiple embedded memories

Li-Ming Denq,, Rei-Fu Huang,, Cheng-Wen Wu,, Yeong-Jar Chang,, Wen-Ching Wu,

Year:

2004

Language:

english

File:

PDF, 239 KB

english, 2004

10

[IEEE 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT) - Hsinchu, Taiwan (27-29 April 2005)] 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). - Embedded memory diagnostic data compression using differential address

Chin-Lung Su,, Rei-Fu Huang,, Cheng-Wen Wu,, Yeong-Jar Chang,, Shen-Tien Lin,, Wen-Ching Wu,

Year:

2005

Language:

english

File:

PDF, 648 KB

english, 2005

11

[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - MRAM defect analysis and fault modeling

Chin-Lung Su,, Rei-Fu Huang,, Cheng-Wen Wu,, Chien-Chung Hung,, Ming-Jer Kao,, Yeong-Jar Chang,, Wen-Ching Wu,

Year:

2004

Language:

english

File:

PDF, 648 KB

english, 2004

12

[IEEE Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Xi'an, China (2003.11.19-2003.11.19)] Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - A processor-based built-in self-repair design for embedded memories

Chin-Lung Su,, Rei-Fu Huang,, Cheng-Wen Wu,

Year:

2003

Language:

english

File:

PDF, 235 KB

english, 2003

13

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Fault models and test methods for subthreshold SRAMs

Lin, Chen-Wei, Chen, Hung-Hsin, Yang, Hao-Yu, Chao, Mango C.-T., Huang, Rei-Fu

Year:

2010

Language:

english

File:

PDF, 443 KB

english, 2010

14

A built-in self-repair design for RAMs with 2-D redundancy

Jin-Fu Li,, Yeh, J.-C., Rei-Fu Huang,, Cheng-Wen Wu,

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2005

Language:

english

File:

PDF, 403 KB

english, 2005

15

[IEEE Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Xi'an, China (2003.11.19-2003.11.19)] Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Defect oriented fault analysis for SRAM

Rei-Fu Huang,, Yung-Fa Chou,, Cheng-Wen Wu,

Year:

2003

Language:

english

File:

PDF, 376 KB

english, 2003

16

Raisin: Redundancy Analysis Algorithm Simulation

Rei-Fu Huang, Jin-Fu Li, Jen-ChiehYeh, Cheng-Wen Wu

Journal:

IEEE Design & Test of Computers

Year:

2007

Language:

english

File:

PDF, 783 KB

english, 2007

17

Fault Models and Test Methods for Subthreshold SRAMs

Lin, Chen-Wei, Chen, Hung-Hsin, Yang, Hao-Yu, Huang, Chin-Yuan, Chao, Mango C.-T., Huang, Rei-Fu

Journal:

IEEE Transactions on Computers

Year:

2013

Language:

english

File:

PDF, 2.00 MB

english, 2013

18

Testing Methodology of Embedded DRAMs

Yang, Hao-Yu, Chang, Chi-Min, Chao, Mango C.-T., Huang, Rei-Fu, Lin, Shih-Chin

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2012

Language:

english

File:

PDF, 1.96 MB

english, 2012

19

[IEEE 2004 IEEE International Workshop on Current and Defect Based Testing - Napa Valley, CA, USA (25 April 2004)] Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004) - A memory built-in self-diagnosis design with syndrome compression

Rei-Fu Huang,, Chin-Lung Su,, Cheng-Wen Wu,, Yeong-Jar Chang,, Wen-Ching Wu,

Year:

2004

Language:

english

File:

PDF, 445 KB

english, 2004

20

[IEEE Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (28-29 July 2003)] Proceedings the Third IEEE Workshop on Internet Applications. WIAPP 2003 - A testability-driven optimizer and wrapper generator for embedded memories

Rei-Fu Huang,, Li-Ming Denq,, Cheng-Wen Wu,, Jin-Fu Li,

Year:

2003

Language:

english

File:

PDF, 229 KB

english, 2003

21

[IEEE Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - Isle of Bendor, France (8-10 July 2002)] Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - A simulator for evaluating redundancy analysis algorithms of repairable embedded memories

Rei-Fu Huang,, Jin-Fu Li,, Jen-Chieh Yeh,, Cheng-Wen Wu,

Year:

2002

Language:

english

File:

PDF, 287 KB

english, 2002

22

[ACM Press the 49th Annual Design Automation Conference - San Francisco, California (2012.06.03-2012.06.07)] Proceedings of the 49th Annual Design Automation Conference on - DAC '12 - Alternate hammering test for application-specific DRAMs and an industrial case study

Huang, Rei-Fu, Yang, Hao-Yu, Chao, Mango C.-T., Lin, Shih-Chin

Year:

2012

Language:

english

File:

PDF, 1.79 MB

english, 2012

23

A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories

Su, Chin-Lung, Huang, Rei-Fu, Wu, Cheng-Wen, Luo, Kun-Lun, Wu, Wen-Ching

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2011

Language:

english

File:

PDF, 1.04 MB

english, 2011

24

[ACM Press the 46th Annual Design Automation Conference - San Francisco, California (2009.07.26-2009.07.31)] Proceedings of the 46th Annual Design Automation Conference on ZZZ - DAC '09 - Fault models for embedded-DRAM macros

Chao, Mango C.-T., Yang, Hao-Yu, Huang, Rei-Fu, Lin, Shih-Chin, Chin, Ching-Yu

Year:

2009

Language:

english

File:

PDF, 627 KB

english, 2009

25

[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Testing Methodology of Embedded DRAMs

Chang, C.-M., Chao, M.C.-T., Rei-Fu Huang,, Ding-Yuan Chen,

Year:

2008

Language:

english

File:

PDF, 3.56 MB

english, 2008

26

[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - A simulator for evaluating redundancy analysis algorithms of repairable embedded memories

Rei-Fu Huang,, Jin-Fu Li,, Jen-Chieh Yeh,, Cheng-Wen Wu,

Year:

2002

Language:

english

File:

PDF, 274 KB

english, 2002

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски